Statit™ Software, Inc. Newsletter

November 2007
In This Issue
Real-time History Preventing Tomorrow's Defects Today
Uses of the Range Chart
How to Get More from a Metric Like PPM-D
Quality Q&A: P Charts are Best for Yield Data
Statit Software Releases Statit e-QC 4.0
First Pass Yield
Real-time History Preventing Tomorrow's Defects Today 
written by Dirk Dean, Hitachi Computer Products America, Inc.
 

The Problem: A challenge facing Hitachi Computer Products America, Inc. was readily available information on the historical quality performance for the product being run, at the time of the run. The production schedule calls for a low volume high mix of complicated circuit board assembles (PCBA), and to just remember the historical defects and potential risks is difficult. The historical information is available but is trapped in databases, reports, and other electronic data storage locations and is not easily available to the line operators. If the "Quality Performance History" information was available to the operators when they needed it, it would allow them the opportunity to prevent potential future defects.

Uses of the Range Chart 
by Marilyn & Robert Hart

All quality control professionals are familiar with the range (R) chart as a control chart to monitor the variability of the product. Actually, in its normal use, the R chart monitors the total variability of the product and the measurement system. A second use of the R chart is to monitor the variability if the measurement system and knowing that, the actual variability of just the product can be found.

How to Get More from a Metric Like PPM-D (Parts-Per-Million Defective)

A Supplier Quality Engineer (SQE), across a broad range of industries, is often the gateway for information from suppliers regarding the conformance to specification (e.g. Quality Acceptance Certificates or Letters) concerning shipments entering the supply chain. Additionally, as part of a purchase contract or working agreement, supplemental information from the Supplier regarding the production of parts is included with the shipment. By requesting and monitoring the right statistics, the SQE can glean insights into events on the ground at the supplier site that might not be forthcoming during regular interactions.

This article delves into an example of monitoring a simple statistic (Quality Metric), Parts-per-Million Defective, to discover a potential process change at the supplier, which may have been unanticipated, and how to automate data acquisition and analysis with the goal being maximal visibility of quality data and use of the underlying natural distribution of the Quality Metric to enhance the relationship with your supplier. 
 
Quality Q&A: P Charts are Best for Yield Data

Q. Which is the better chart to use for analysis of yield data: the p-chart or the individual-moving range chart? I am trying to better understand the changes in the weekly test yields on our electronic product lines. I've used both p-charts and individual charts with different results. The p-chart seems much more sensitive and provides many more out-of-control indications than the individual chart.

 
A. Your observation that the p-chart is more sensitive is correct and statistically expected. The p-chart is designed for data in the form of proportions and takes into account the sample size when calculating the control limits. As the sample size goes up, the sensitivity of all control charts increases. This increased sensitivity means that the p-chart is better able to detect process changes as they occur.
 
Although it is technically possible to make an individual chart using the individual yield proportions, it is not the correct chart to use for this type of data, as explained below.
 
Read on...
Statit Software Releases Statit e-QC 4.0

Statit Software is pleased to announce the release of Statit e-QC 4.0, the latest version of its leading web solution for process and performance improvement initiatives.

 

Hundreds of organizations worldwide use Statit solutions to access the information they need to monitor, analyze, and improve key quality metrics.

 

This new release of Statit e-QC contains many key enhancements including:

  • Enhanced usage reporting tracks activity and users in the application
  • Run Statit e-QC reports directly from links on your intranet pages without having to log into the application
  • Password security enhancements provides for additional levels of password sophistication
  • Login pass-throughs allows login information from intranet pages or desktop application to be passed directly to Statit e-QC.

Statit e-QC 4.0 is now available. For more information on the new release or a short WebEx demonstration of these new capabilities, contact Statit Software at (800) 478-2892 or email info@statit.com.

Something You'd Like to See? 
Is there a topic you'd like us to discuss? Have a process improvement question? If so, submit a topic request and we'll see that your topic gets covered in an upcoming edition of the Statit Bulletin.
 
First Pass Yield
In this complimentary webinar, Guy March, Vice President of Professional Services for Statit Software, will discuss First Pass Yield. We will look at different charting solutions and examine different ways to better understand underlying issues. First Pass Yield is an important measure, whether we are talking about a process step pass, system pass, or Rolled throughput yield. We will examine these and associated questions using Statit e-QC

By attending this webcast, you will:

  • Examine several methods of viewing First Pass Yield 
  • Understand how to get to the underlying causes of FPY issues 
  • Use Statit e-QC to understand failures and potential sources of yield loss 
Quick Links
SPC Chart Guides  Quality Practice Tips 
Join Our Mailing List