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X-Bar Charts vs. Cumulative Sum Charts


Cumulative Sum charts, or Cusum charts, are an alternative to Shewhart control charts. While Shewhart control charts are widely used and the control violations well documented, there may be conditions to which they are insensitive. This technique determines an average value for the subgroups and determines the expected variability about the mean. These charts are good at detecting distinct, steady and intermittent shifts in the process.

Cusum charts are better suited to detecting small, sustained shifts in a process. These charts measure a cumulative deviation from the mean or a target value. Depending on the type of test used, the chart either displays the standardized deviation from the target or the mean value of the subgroup size.

The types of tests used to evaluate an out-of-control condition are the run-sum and the V-mask. The V-mask standardizes the deviations from the mean, or target value, and plots the deviations from this value. If the process remains in control, then the deviations will scatter around the target. On the Cusum chart, this will produce a straight line or a random shift around the target with a mean of zero.

The run-sum method of evaluating a Cusum chart plots the subgroup average, similar to a Shewhart chart. However, instead of using control chart rules to detect a violation, the user sets a limit, or score, of cumulative deviation from target as the signal of a violation. For example, if the first subgroup average is 1 unit above the target, the score is set to 1. If the next subgroup average is 1 unit below the target, the subgroup score is –1. The cumulative sum becomes 1+(-1)=0. This is what would be expected with random variation about the target. If the process mean is shifting up or down, then the score continues to increase or decrease. Violations are identified when the cumulative score exceeds a threshold value set by the user.

Once a violation has occurred, a decision must be made regarding whether the cumulative score should be reset. With this method, the user has the option of resetting the score once a problem has been detected and resolved. If the score is not reset, violations in the opposite direction may not become apparent or may trigger warnings in the same direction as the first violation that are not actual violations.

In both the run-sum and V-mask methods, the user has the option to specify the criteria for determining deviation. By default, the process mean is used as the target value. The alternative is to enter the desired target. For the run-sum technique, the user also has the option to specify the magnitude of the cumulative deviation from the target before a violation is identified.

In the following example, a Cusum chart depicts mean oven temperature for subgroups of 20 runs. This chart uses the run-sum test. The run-sum score that defines a violation is set to 8 and is reset upon reaching that threshold. This technique suggests that a significant upward shift in the mean occurs by run 20. Since we are using the run-sum test, the scores must be steadily increasing in order for the score to reach the threshold value. If the mean were fluctuating above and below the overall mean, the score would alternately increment and decrement and remain below the threshold value.

This chart is set to reset the score after a violation occurs. If the subgroup means do not continue to shift either above or below the overall mean, we would not expect to see further violations unless another significant drift occurs. In this chart, there is a second violation identified by run 30. This violation indicates a downward shift in the mean. This example clearly illustrates the results of a 2-sided test. The maximum score allowed before identifying a violation is used for both positive and negative drifts in the subgroup means. While there is no need to specify that the absolute value of the score is being tested, the chart successfully evaluates the drift of subgroup means in both directions.

The next example uses the same data but with a V-mask test. The values plotted on this chart are standardized values. This means that the difference between the subgroup mean and the overall mean is plotted in lieu of the actual subgroup mean. This method provides visibility into the magnitude of the temperature drift.

This test is also a 2-sided test. Upward shifts in the mean are detected by points plotted above the upper V-mask line. Downward shifts are detected by points plotted below the lower V-mask line.

Using the V-mask test also shows that there is significant upward drift in the subgroup means that occurs by run 20. It is possible to modify features of this test. Options exist to change the slope of the V, alter the probability of a Type 1 error and other options that are beyond the scope of this discussion.

Note that this test does not show a significant decrease in temperature from the overall average, at least not yet. If the trend continues, it appears that the points will soon fall below the lower line.

The final chart uses the same data in subgroups of 20 to produce a Shewhart X-bar chart. The X-bar chart detects a violation at run 19. The rule that is violated is 4 of 5 successive points are in lower Zone B or beyond. The subgroup average does not fall outside of the 3-sigma limit until run 30. These results indicate that the suggestion of increased temperature in not significant, but the decrease in subgroup temperature is significant.

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For the sake of completeness, the S-chart for this data follows. The S-chart shows no violations that could cause concern over the temperature variability within subgroups.

The decision for choosing Shewhart charts over Cusum charts depends on the process. If small changes negatively impact the process and must be resolved quickly, then Cusum charts may be critical tools. If the process works well within the parameters defined in Shewhart charts, then they are the appropriate choice. It is important to know what options are available. There may be situations when a combination of these tools is warranted to detect necessary process details.

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